Measurement of carrier envelope offset frequency for a 10 GHz etalon-stabilized semiconductor optical frequency comb


Creative Commons License

Akbulut M., Davila-Rodriguez J., ÖZDÜR İ. T. , Quinlan F., Ozharar S., Hoghooghi N., et al.

OPTICS EXPRESS, cilt.19, no.18, ss.16851-16865, 2011 (SCI İndekslerine Giren Dergi) identifier identifier identifier

  • Cilt numarası: 19 Konu: 18
  • Basım Tarihi: 2011
  • Doi Numarası: 10.1364/oe.19.016851
  • Dergi Adı: OPTICS EXPRESS
  • Sayfa Sayısı: ss.16851-16865

Özet

We report Carrier Envelope Offset (CEO) frequency measurements of a 10 GHz harmonically mode-locked, Fabry-Perot etalon-stabilized, semiconductor optical frequency comb source. A modified multi-heterodyne mixing technique with a reference frequency comb was utilized for the measurement. Also, preliminary results from an attempt at f-2f self-referencing measurement are presented. The CEO frequency was found to be similar to 1.47 GHz for the particular etalon that was used. (C) 2011 Optical Society of America