Measurement of carrier envelope offset frequency for a 10 GHz etalon-stabilized semiconductor optical frequency comb

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Akbulut M., Davila-Rodriguez J., ÖZDÜR İ. T., Quinlan F., Ozharar S., Hoghooghi N., ...More

OPTICS EXPRESS, vol.19, no.18, pp.16851-16865, 2011 (SCI-Expanded) identifier identifier identifier

  • Publication Type: Article / Article
  • Volume: 19 Issue: 18
  • Publication Date: 2011
  • Doi Number: 10.1364/oe.19.016851
  • Journal Name: OPTICS EXPRESS
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.16851-16865
  • Abdullah Gül University Affiliated: No

Abstract

We report Carrier Envelope Offset (CEO) frequency measurements of a 10 GHz harmonically mode-locked, Fabry-Perot etalon-stabilized, semiconductor optical frequency comb source. A modified multi-heterodyne mixing technique with a reference frequency comb was utilized for the measurement. Also, preliminary results from an attempt at f-2f self-referencing measurement are presented. The CEO frequency was found to be similar to 1.47 GHz for the particular etalon that was used. (C) 2011 Optical Society of America