Optical Frequency Stability Measurement Using an Etalon-Based Optoelectronic Oscillator

ÖZDÜR İ. T., Mandridis D., Piracha M. U., Akbulut M., Hoghooghi N., Delfyett P. J.

IEEE PHOTONICS TECHNOLOGY LETTERS, vol.23, no.4, pp.263-265, 2011 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 23 Issue: 4
  • Publication Date: 2011
  • Doi Number: 10.1109/lpt.2010.2100375
  • Journal Name: IEEE PHOTONICS TECHNOLOGY LETTERS
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.263-265
  • Abdullah Gül University Affiliated: No

Abstract

A novel method of measuring the optical frequency stability of a continuous-wave (CW) laser by using an etalon-based optoelectronic oscillator is demonstrated. A 1000 finesse Fabry-Perot etalon is used as a reference which eliminates the need of using an independent optical source as a frequency reference. Using this technique, the optical frequency stability of a CW laser is measured with similar to 3.5-kHz optical frequency resolution at update rates of 90 Hz.