Exploiting a fast and simple ECC for scaling supply voltage in level-1 caches

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Yalcin G. , Islek E., Tozlu O., REVIRIEGO P., Cristal A., UNSAL O. S. , ...More

20th IEEE International On-Line Testing Symposium, IOLTS 2014, Catalunya, Spain, 7 - 09 July 2014, pp.1-6

• Publication Type: Conference Paper / Full Text
• Doi Number: 10.1109/iolts.2014.6873660
• City: Catalunya
• Country: Spain
• Page Numbers: pp.1-6